EN
AOI / Inspection
High-performance vision and appearance inspection solutions that detect even the smallest defects
Pattern AOI uses high-performance vision algorithms to detect and automatically classify opens, shorts and fine particles in real time. MACRO Inspection uses variable optical illumination angles to identify and control mura through visual and vision-based inspection. Our specialized algorithms cover key display applications, including TFT, color filters, LTPS and OLED, while support for large substrates (G8.5–G10.5) and high-speed scanning at 1.2 seconds or less per point provide fast, comprehensive inspection.
OLED
Backplane AOI
- Foreign matter and microdefect inspection on holes and rib surfaces
- Detection size: ≥ 3 μm (95% detection rate)
- Optical resolution: 1.5 μm (varies by specification)
- Inspection coverage: 100%
- (Within the active area; no uninspected areas)
TFT
AOI
- TFT glass pattern array defect and particle inspection
- Defect Resolution (Standalone : 3~5μm)
- Final Inspection
- Key defects: array shorts, opens and particles
CF
AOI
- Inspection of various CF glass surface defects
- Defect Resolution (Standalone: 10μm / In-Line: 20μm)
- Layer Inspected: BM, Red, Green, Blue, OC, CS
- Key defects: stains, particles, scratches, black spots and white spots
Manual Macro
Inspection
- Manual visual inspection systems for CF and TFT
- Optimized expertise in large-area defects and nonuniform pattern inspection
- Highly flexible stage and system configuration
- Key defects: photo (R/G/B) row line mura and mura
